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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf | 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf | 03/11/21 | Keysight Technologies Current Sensin | 98 kB | 1 | Agilent | 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2] |
| 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati | 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati | 29/09/21 | Keysight Technologies Humidity-dependent | 117 kB | 2 | Agilent | 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati |
| 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8].pdf | 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8].pdf | 01/02/20 | Keysight 7500 AFM | 858 kB | 10 | Agilent | 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8] |
| 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2].pdf | 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2].pdf | 12/10/21 | Keysight Technologies 7500 AFM Applicati | 186 kB | 1 | Agilent | 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2] |
| 5991-3468EN Humidity-dependent AFM Nanolithography - Application Note c20141020 [2].pdf | 5991-3468EN Humidity-dependent AFM Nanolithography - Application Note c20141020 [2].pdf | 27/08/20 | Keysight Technologies Humidity-dependent | 107 kB | 1 | Agilent | 5991-3468EN Humidity-dependent AFM Nanolithography - Application Note c20141020 [2] |
| 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2].pdf | 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2].pdf | 28/08/20 | 290 kB | 1 | Agilent | 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2] | |
| 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdf | 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdf | 26/08/20 | Keysight Technologies High Resolution Im | 266 kB | 1 | Agilent | 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4] |
| 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 | 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 | 14/06/21 | Keysight 5600LS AFM Surface Potential Me | 964 kB | 1 | Agilent | 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 |
| 5991-3251EN Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Appl | 5991-3251EN Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Appl | 26/10/21 | Keysight Technologies Vapor Annealing Ef | 116 kB | 3 | Agilent | 5991-3251EN Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Appl |
| 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 | 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 | 12/10/21 | Keysight Technologies Magnetic Force Mic | 287 kB | 1 | Agilent | 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 |
| 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf | 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf | 26/08/20 | Keysight Technologies AFM/SPM Accessorie | 658 kB | 3 | Agilent | 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20] |
| 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4].pdf | 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4].pdf | 25/08/21 | Keysight Technologies Elastic Modulus Ma | 138 kB | 1 | Agilent | 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4] |
| 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl | 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl | 15/06/21 | Keysight Technologies Differentiating Su | 467 kB | 3 | Agilent | 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl |
| 5600LS AFM Enhanced Sample Versatility_ 300mm Wafer Vacuum Chuck 5991-2014EN c20140825 [2].pdf | 5600LS AFM Enhanced Sample Versatility_ 300mm Wafer Vacuum Chuck 5991-2014EN c20140825 [2].pdf | 25/09/21 | Keysight 5600LS AFM Enhanced Sample Vers | 306 kB | 3 | Agilent | 5600LS AFM Enhanced Sample Versatility 300mm Wafer Vacuum Chuck 5991-2014EN c20140825 [2] |
| 5989-6405EN English _ 2013-08-30 _ PDF 1.31 MB c20141106 [8].pdf | 5989-6405EN English _ 2013-08-30 _ PDF 1.31 MB c20141106 [8].pdf | 27/11/19 | Keysight Technologies 5500 AFM | 1889 kB | 2 | Agilent | 5989-6405EN English 2013-08-30 PDF 1.31 MB c20141106 [8] |
| Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6].pdf | Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6].pdf | 29/08/20 | Keysight Technologies Scanning Microwave | 320 kB | 1 | Agilent | Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6] |
| MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note 5991-3672EN c20141020 [2]. | MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note 5991-3672EN c20141020 [2]. | 13/08/21 | Keysight Technologies MAC Mode Imaging o | 108 kB | 1 | Agilent | MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note 5991-3672EN c20141020 [2] |
| Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note 5989 | Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note 5989 | 21/11/21 | Keysight Technologies Attaching Antibodi | 329 kB | 1 | Agilent | Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note 5989 |
| Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note | Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note | 01/08/21 | Keysight Technologies Attaching Antibodi | 742 kB | 3 | Agilent | Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note |
| 5991-4525EN AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet c20140829 [2].pdf | 5991-4525EN AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet c20140829 [2].pdf | 15/06/21 | Keysight Technologies SECM Mode AFM-Enab | 90 kB | 1 | Agilent | 5991-4525EN AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet c20140829 [2] |